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Strain Mapping Using EBSD Cross Correlation and Raman Methods
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 960-961
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- August 2018
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Certified Reference Material for Strain Measurement Using EBSD
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1895-1896
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- August 2015
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Excellent Agreement Between High Resolution EBSD and XRD Strain Measurements on Si1-xGex films on Si
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 690-691
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- August 2013
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Effect of crystallographic orientation on phase transformations during indentation of silicon
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- Journal of Materials Research / Volume 24 / Issue 3 / March 2009
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1172-1183
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- March 2009
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The Stress State and Domain Structure of Epitaxial PbZr0.2Ti0.8O3 Films on (001) SrTiO3 with and without La0.5Sr0.5CoO3 Electrode Layer
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- Journal:
- MRS Online Proceedings Library Archive / Volume 541 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 357
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- 1998
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Growth of Epitaxial BaTiO3 Thin Films at 600°C by Metalorganic Chemical Vapor Deposition
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- MRS Online Proceedings Library Archive / Volume 361 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 355
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- 1994
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Crystallographic Aspects of Ferroelectric Pzt Thin Films Prepared by Laser Deposition Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 243 / 1991
- Published online by Cambridge University Press:
- 25 February 2011, 423
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- 1991
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Powder X-Ray Diffraction Characterization of Laser Deposited Ferroelectric Thin Films
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- Journal:
- Advances in X-ray Analysis / Volume 35 / Issue A / 1991
- Published online by Cambridge University Press:
- 06 March 2019, pp. 211-220
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- 1991
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Texturing and Dielectric Properties of Laser Deposited BaTiO3 Thin Films Grown on Heated Substrates
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- MRS Online Proceedings Library Archive / Volume 243 / 1991
- Published online by Cambridge University Press:
- 25 February 2011, 513
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- 1991
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Grain Boundary Characterization in Ni3Al
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- Journal:
- MRS Online Proceedings Library Archive / Volume 122 / 1988
- Published online by Cambridge University Press:
- 26 February 2011, 461
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- 1988
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